| Titre : | Current Mode Atomic Force Microscopy (C-AFM) Study for Local Electrical Characterization of Conjugated Polymer Blends |
| Auteurs : | Li-Ting Lee, Auteur ; Shinzaburo Ito, Auteur ; Hiroaki Benten, Auteur ; Hideo Ohkita, Auteur ; Daisuke Mori, Auteur |
| Type de document : | Article |
| Dans : | AMBIO (41(3) MAR 2012) |
| Article en page(s) : | 135-137 |
| Langues: | Anglais |
| Résumé : | A blend of regioregular poly(3-hexylthiophene) (P3HT) and poly{[N,N'-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2, 6-diyl]-alt-5,5'-(2,2'-bithiophene)} (P(NDI2OD-T2), which has the potential for polymer solar cells application, was prepared for current mode atomic force microscopy (C-AFM) measurements in this study. Phase-separated domains and the local electrical characteristics of P3HT/P(NDI2OD-T2) blends were investigated by the C-AFM. |



